CONTACT:
Gian Carlo Gazzadi (giancarlo.gazzadi@nano.cnr.it)
Areas of interest: NANOFABRICATION; ELECTRONIC MICROSCOPY
TECHNOLOGICAL ACTIVITY OFFERED
Nanofabrication by direct Focused Ion Beam (FIB) lithography through removal and/or deposition of material. (Figs. 1 and 2)
Analysis of materials by a combination of FIB microsection and electron microscopy (SEM) (Fig. 3)
FIB preparation of samples by transmission electron microscopy (TEM) (Fig. 4)
DESCRIPTION OF RELATED RESEARCH
Nanopatterning of TEM holograms on membranes (Fig. 1)
Deposition and study of magnetic nanostructures (Fig. 2)
English 
Italian